- 製品
- PowerArtistRTL Power Reduction, Analysis, Debug, and RPM Generation
- RedHawkSoC Dynamic Power, Advanced Low Power, Reliability, and Chip-Package Co-design
- TotemAnalog/Mixed-Signal Dynamic Power, Substrate Noise, EM, and ESD
- SentinelChip-Package-System Power/Signal Integrity, IO-SSO, Thermal, and EMI
- ResourcesProduct Whitepapers
- フロー
- Ultra Low PowerPower methodology for ultra-low-power designs
- IP IntegrationPower methodology for IP Integration initiative
- Chip-Package-SystemPower methodology for giga-hertz performance
- サポート
- コミュニティ
- 顧客業界をリードするエレクトロニクス企業のために
- パートナーファンドリー、IP、EDA、業界アライアンス
- ブログ
- Chip-Package-Systemグループパワー、ノイズ、信頼性のコンバージェンス
- 会社情報
Apache Customers Share their Design Experiences At DAC Booth #1813
Topics include ultra low power, 32/28nm designs, substrate noise coupling, ESD, SSO & more from AMD, Aptina, Cienna, LSI, Nvidia, NXP, Renesas, Samsung, and ST

Apache Releases Fourth-Generation RedHawk for Sub-20 Nanometer Power Sign-Off
Delivering greater accuracy, capacity and usability for full-chip dynamic power and reliability simulation

A Modeling Approach for Power Integrity Simulation in 3D-IC Designs
Joint article by Texas Instruments and Apache

‘Early and accurate’ power analysis: myth or reality?
Innovation poses new challenges for electronic systems. To address these challenges, power related design decisions are being made throughout the product development cycle.

最新情報
May
7
Design for Reliability – The Golden Age of Simulation Driven ... - EETimes Design
May
5
Apache DesignのLSIの電源/電力解析ツール「RedHawk」、3Dと20nmに対応 - Tech-On! - EDA Online
May
1
Apache Updates Redhawk for Sub-20nm and 3-D Designs - EETimes
Apr
30
Understanding Power Integrity as a System-Wide Challenge - Electronic Design
Apr
27
A Modeling Approach for Power Integrity Simulation in 3D-IC Designs - EETimes Design
イベント情報
注目情報
Reliability Verification For Smart ICs
The electronic brains behind today’s advanced systems are smart ICs, paving the way for consumer electronics, energy, biomedical, automotive and avionics industries. Power efficiency and system integration are keys to the success of these smart systems. More >
Watch the Reliability Webcast
Design for Reliability - An IC Perspective

